Making Technology Possible

Production and R&D

Solutions for Fabs & Labs

Material Characterization

NanoSpec II

Advanced Film Analysis

RPM Blue

Photoluminescence (PL) Mapping

Vertex

PL Mapping System with Power Density Control

Imperia

PL Mapping & Defect Analysis

ECVPro

Electrochemical Capacitance Voltage

QS1200

FTIR Metrology

QS2200

FTIR Metrology - C2C

Stratus

Automated Epi Thickness Monitor

Metrology

Toho HL9900

Hall Effect Measurement

FLX Series

Stress Measurement

TohoSpec 3100

Film Thickness

QuickPRO-3D *

Non-Contact 3D Surface Profiler

QuickOCT-4D *

4D Surface & Thick-Film Profiler

4 Point Probe

Resistivity

CV Mapping

Carrier Concentration

FP Series

Contact Profiler

NanoSpec 6500

Large Area Film Thickness

FPM Series

Optical Profiler

* Opto Alignment products distributed by Toho Technology, Inc.

Optical Alignment

LAS-BT NexGen

Alignment & Inspection of Smaller Lens Assemblies

IAM-BT

Standalone Image Analysis Measurement

LAS-P

Alignment & Inspection of Mid-Sized Lens Assemblies

LAS-UP

Alignment & Inspection of Larger Lens Assemblies

LAS-XUP

Alignment & Inspection of Larger Diameter, Long Radius Optics

Glass

Precision Cleaners

Clean, Etch, and Strip

Automation

Interface Terminals

Multiple Configurations

Terminal Block

Customizable Series

PLC Migration Adapters

Rapid PLC Migration

Relay Boxes

Simple Plug and Play

Toline XM Series

Multiplex Interface

Connect with Toho

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