Toho Profilers are designed to provide accurate profile measurements within applications geared toward FPD large surface area substrates.
- Thin film heights
 - Thick film heights
 - Photo resist / soft films
 - Characterization of surface roughness or waviness
 - Surface Curvature and form
 - 2D stress on thin films
 - Peak to Valley Dimension analysis
 - 3D imaging
 - Flatness
 - Defect Analysis
 
 
					