Toho Profilers are designed to provide accurate profile measurements within applications geared toward FPD large surface area substrates.
- Thin film heights
- Thick film heights
- Photo resist / soft films
- Characterization of surface roughness or waviness
- Surface Curvature and form
- 2D stress on thin films
- Peak to Valley Dimension analysis
- 3D imaging
- Flatness
- Defect Analysis