IAM-BT

Standalone Image Analysis Measurement

Image Analysis Measurement Bench Top (IAM-BT™) offers transmission measurement of on-axis MTF, EFL, BFL, wedge, beam deviation and reflection measurement of FFL, CT and ROC with market leading accuracy in a user friendly package. Intuitive IAM software user-interface provides customers with seamless operation. Fully integrated with the universal Calculens™ software.

IAM-BT

System Characteristics

  • Both sagittal and tangential MTF can be measured and reported
  • Precision circular aperture reticle permits simultaneous calculation of EFL and tangential/sagittal MTF
  • Intuitive IAM software user-interface (UI) provides customers with seamless operation. Fully integrated with the universal LAS Calculens™ software
  • Measurement range scales with the height of the LAS vertical stage
  • Both sagittal and tangential MTF can be measured and reported
  • Precision circular reticle permits simultaneous calculation of EFL and tangential/sagittal MTF
  • Through focus analysis for sharpest image
  • Automatic line detection and region of interest placement
  • Graphs Line Spread Function and tangential/sagittal MTF
  • Fully automated for fast analysis

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